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Single sided imaging sensor.

Pablo J Prado1

  • 1Quantum Magnetics, Inc., 7740 Kenamar Court, San Diego, CA 92121, USA. pprado@qm.com

Magnetic Resonance Imaging
|July 10, 2003
PubMed
Summary
This summary is machine-generated.

A new portable sensor non-invasively measures magnetic resonance (MR) signal depth profiles. This magnetic resonance imaging device enables 2D and 3D imaging for material analysis.

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Area of Science:

  • Geophysics
  • Materials Science
  • Medical Imaging

Background:

  • Non-invasive material analysis is crucial for various industries.
  • Existing magnetic resonance (MR) techniques can be bulky and limited in application.
  • Developing portable, versatile MR sensors is an ongoing challenge.

Purpose of the Study:

  • To present a portable, single-sided sensor for non-invasive depth profiling of MR signals.
  • To demonstrate the device's capability for 2D and 3D magnetic resonance imaging (MRI).
  • To validate the sensor's performance in material analysis applications.

Main Methods:

  • A portable, single-sided sensor with a tailored permanent magnet array was developed.
  • Automated slice selection was achieved using switched capacitors.

Related Experiment Videos

  • A single-channel spectrometer facilitated multi-slice acquisition.
  • RF coil and magnet array geometries were optimized for gradient integration, enabling in-plane spatial resolution.
  • Main Results:

    • The sensor successfully rendered depth profiles of MR signals non-invasively.
    • Flat sensitive volumes were achieved up to 40 mm from the inspection head.
    • The device demonstrated 2D and 3D MRI capabilities.
    • Successful applications included moisture profiling in concrete and porous rocks, and diffusion parameter measurement in a phantom sample.

    Conclusions:

    • The developed portable single-sided sensor offers a novel non-invasive method for MR signal depth profiling.
    • The device's design facilitates 2D and 3D MRI, expanding its utility.
    • The sensor shows promise for in-situ material analysis and characterization.