Tatsuo Shiina1, Yohei Moritani, Masafumi Ito
1Faculty of Systems Engineering, Wakayama University, 930 Sakaedani, Wakayama-shi, Wakayama 640-8510, Japan. shiina@sys.wakayama-u.ac.jp
A novel scanning mechanism uses rotating corner reflectors to precisely alter long optical paths. This innovation enhances optical coherence tomography systems with high accuracy for material analysis.
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