Related Experiment Video

Updated: Jul 21, 2026

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
15:06

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Published on: January 3, 2016

Plasmon energy mapping in energy-filtering transmission electron microscopy

W Sigle1, S Krämer, V Varshney

  • 1Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, D-70569, Stuttgart, Germany. sigle@mf.mpg.de

Ultramicroscopy
|July 23, 2003
PubMed

Keywords:
plasmon energy analysiselectron microscopy techniquesnanomaterial characterizationenergy-filtered imaging

More Related Videos

Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography08:15

Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography

Published on: June 9, 2018

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons07:39

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Published on: July 21, 2018

Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...