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Related Experiment Videos

Near-field scanning optical microscopy imaging of multimode interference.

A L Campillo1, C K Madsen, J W P Hsu

  • 1Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974, USA.

Optics Letters
|July 26, 2003
PubMed
Summary

Near-field scanning optical microscopy (NSOM) directly images multimode interference couplers. This powerful technique overcomes calculation uncertainties, enabling accurate study of waveguide devices.

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Area of Science:

  • Photonics
  • Optical Engineering
  • Materials Science

Background:

  • Multimode interference (MMI) couplers are essential in integrated photonics.
  • Accurate characterization of MMI couplers is crucial for device performance.
  • Existing methods rely on calculations with inherent uncertainties in waveguide dimensions.

Purpose of the Study:

  • To directly image the intensity distribution in a 2x2 MMI coupler.
  • To investigate the wavelength dependence of the intensity distribution.
  • To demonstrate a novel imaging technique for waveguide devices.

Main Methods:

  • Utilized a near-field scanning optical microscope (NSOM) in collection mode.
  • Directly imaged the optical intensity distribution along the MMI coupler.

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  • Varied the wavelength to study its effect on the intensity patterns.

    • Main Results:

    • Successfully imaged the intensity distribution as a function of wavelength.
    • Observed wavelength-dependent intensity distributions and image positions.
    • Demonstrated that NSOM imaging bypasses uncertainties associated with waveguide width calculations.

    Conclusions:

    • NSOM is a powerful and accurate technique for studying MMI couplers.
    • Direct imaging provides superior accuracy compared to theoretical calculations with uncertain parameters.
    • This method facilitates a deeper understanding of waveguide device behavior.