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Diffraction and line shape of Fourier-transform spectrometers.

Jérôme Genest1, Pierre Tremblay

  • 1Centre d'optique, photonique et laser, Département de génie electrique et de genie informatique, Université Laval, Québec, Canada G1K 7P4. jgenest@site.uottawa.ca

Applied Optics
|August 15, 2003
PubMed
Summary

This study analyzes diffraction effects on Fourier-transform spectrometer line shapes using a model. Diffraction is negligible compared to field-of-view effects under specific instrument throughput conditions.

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Area of Science:

  • Spectroscopy
  • Optical Instrumentation
  • Physical Optics

Background:

  • Fourier-transform spectrometers (FTS) are crucial for spectral analysis.
  • Instrument line shape (ILS) determines spectral resolution and accuracy.
  • Diffraction can influence the ILS, potentially impacting measurements.

Purpose of the Study:

  • To analytically model and quantify the effect of diffraction on the ILS of FTS.
  • To derive conditions under which diffraction effects are negligible.
  • To compare diffraction's impact across different FTS designs.

Main Methods:

  • Development of an analytical line-shape model for FTS.
  • Derivation of the instrument line shape expression for a diffracted point source.
  • Analysis of the relationship between diffraction and field-of-view effects.

Main Results:

  • An expression for the instrument line shape considering diffraction was obtained.
  • A condition for negligible diffraction effects based on instrument throughput was derived.
  • The relative significance of diffraction versus field-of-view broadening was illustrated.

Conclusions:

  • Diffraction is a factor influencing FTS line shapes.
  • Instrument throughput is a key parameter in managing diffraction's impact.
  • Understanding these effects is vital for accurate spectral measurements with FTS.