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Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation
Stefano Cattaneo1, Martti Kauranen
1Institute of Physics, Optics Laboratory, Tampere University of Technology, P.O. Box 692, FIN-33101 Tampere, Finland. stefano.cattaneo@tut.fi
Optics Letters
|August 29, 2003
Abstract:
We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.