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Updated: Sep 20, 2026

Diffuse Reflectance Infrared Spectroscopic Identification of Dispersant/Particle Bonding Mechanisms in Functional Inks
Published on: May 8, 2015
[Investigation of a-SiOxNy thin film by infrared absorption]
Abstract:
Infrared absorptive characteristics of a-SiOxNy thin film was investigated by altering O and N content. Various molecular bonds were identified by the infrared absorption measurement. 1,105 and 865 cm-1 peaks are associated with single Si-O and Si-N modes respectively. When the O and N contents increase, the peaks associated with the symmetry and anti-symmetry modes of O-Si-O and N-Si-N are measured. For N-Si-O, the absorptive peaks of Si-O and Si-N mode are located at 1,036 and 890 cm-1 respectively.
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