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Effects of interface roughness on the spectral properties of thin films and multilayers
Alexander V Tikhonravov1, Michael K Trubetskov, Andrei A Tikhonravov
1Research Computing Center, Moscow State University, Leninskie Gory, 119992, Moscow, Russia. tikh@tikh.srcc.msu.su
Applied Optics
|September 10, 2003
Abstract:
We introduce two parameters, large-scale and small-scale rms roughness, to take into account the interface properties of thin films and multilayers in the calculation of their specular reflectance and transmittance. A theoretical motivation for the introduction of these two parameters instead of a standard single rms roughness is provided. Experimental power spectral density functions of several samples are used to illustrate ways in which the parameters introduced can be evaluated.