Background correction by wavelength modulation for pulsed-laser-excited atomic fluorescence spectrometry

E G Su1, R L Irwin, Z Liang

  • 1Department of Chemistry, University of Connecticut, Storrs 06269-3060.

Analytical Chemistry
|August 1, 1992
PubMed
Summary

A new method uses wavelength modulation (WM) in laser-excited atomic fluorescence spectrometry (LEAFS) to correct for background noise. This technique effectively removes interference from flames, furnaces, and matrix particles, improving analytical accuracy.

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