Chih-Yu Chao1, Tung-Cheng Pan, Chia-Fu Chou
1Department of Physics, National Taiwan University, Taipei 10617, Taiwan, Republic of China. cychao@phys.ntu.edu.tw
Electron diffraction reveals structural differences in freestanding thin films. Even with similar positional correlations, 14S5 films show extensive multiple diffraction, unlike 4O.8 films, indicating distinct structural order.
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