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Updated: Aug 30, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Low-coherence tandem interferometer for measurement of group refractive index without knowledge of the thickness of
Akiko Hirai1, Hirokazu Matsumoto
1National Institute of Advanced Industrial Science and Technology, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan. a-hirai@aist.go.jp
Abstract:
A new low-coherence interferometric technique is proposed for measuring the group refractive indices of dispersive samples with high accuracy. A tandem configuration of interferometers is used to compensate for the asymmetrical distortion of interferograms that results from the broad spectrum of the light source. The group refractive index can be measured without knowledge of the geometrical thickness of the sample under test. The proposed technique can successfully measure even a thick sample. Computer calculations have shown the effectiveness of the proposed technique, which was verified by preliminary experiments; the difference between the experimental result and the catalog data was 7 x 10(-4).
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