Related Experiment Video
Updated: Jan 13, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Direct atom-resolved imaging of oxides and their grain boundaries
Zaoli Zhang1, Wilfried Sigle, Fritz Phillipp
1Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, D-70569 Stuttgart, Germany.
Abstract:
Using high-resolution transmission electron microscopy, we obtained structure images of strontium titanate (SrTiO3) with a clearly resolved oxygen sublattice along different crystallographic directions in the bulklattice and for a Sigma3 tilt grain boundary. Comparison with image simulations showed that the grain boundary contains oxygen vacancies. Measurements of atom displacements near the grain boundary revealed close correspondence with theoretical calculations.
Related Concept Videos
Atomic Absorption Spectroscopy: Atomization Methods
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Atomic Fluorescence Spectroscopy

