Optimized preparation of cross-sectional TEM specimens of organic thin films

A C Dürr1, F Schreiber, M Kelsch

  • 1Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, D-70569 Stuttgart, Germany. arndt.duerr@mf.mpg.de

Ultramicroscopy
|November 12, 2003
PubMed