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Updated: Aug 16, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Environmental effects in the third moment of voltage fluctuations in a tunnel junction
B Reulet1, J Senzier, D E Prober
1Departments of Applied Physics and Physics, Yale University, New Haven, CT 06520-8284, USA.
Abstract:
We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on nonsuperconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1 GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.
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