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Polysaccharide properties probed with atomic force microscopy

N I Abu-Lail1, T A Camesano

  • 1Department of Chemical Engineering, Worcester Polytechnic Institute, Worcester, MA 01609, USA.

Journal of Microscopy
|November 25, 2003
PubMed
Summary

Atomic force microscopy (AFM) offers high-resolution characterization of polysaccharides. This technique measures forces and properties like adhesion and elasticity, advancing biopolymer research.

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