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Updated: Aug 30, 2026

Analysis of Volatile and Oxidation Sensitive Compounds Using a Cold Inlet System and Electron Impact Mass Spectrometry
Published on: September 5, 2014
Analysis of ketones by selected ion flow tube mass spectrometry
David Smith1, Tianshu Wang, Patrik Spanĕl
1Centre for Science and Technology in Medicine, School of Medicine, Keele University, Thornburrow Drive, Hartshill, Stoke-on-Trent ST4 7QB, UK. d.smith@bemp.keele.ac.uk
Abstract:
A selected ion flow tube mass spectrometry (SIFT-MS) study of the reactions of H3O+, NO+ and O2+* ions with the ketones (M) 2-heptanone, 2-octanone, 2-nonanone, 2-undecanone and 2-aminoacetophenone has been conducted in preparation for studies of volatile emissions from bacteria. The H3O+ reactions all proceed rapidly via exothermic proton transfer, producing only MH+ ions that form their monohydrates when water vapour is present in the helium carrier gas. The O2+* reactions proceed rapidly via dissociative charge transfer producing parent cations M+* and some fragment ions. The NO+ reactions form the NO+M adduct ions at rates which are dependent on the pressure of the helium carrier gas. Combining the present NO+ kinetic data with those available from previous SIFT studies, the phenomenon of charge transfer complexing is clearly demonstrated. This results in adduct formation in these NO+/ketone reactions at or near the collisional rate. SIFT-MS spectra are presented to illustrate the simplicity of SIFT-MS analysis of ketones using both H3O+ and NO+ precursor ions.
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