Recent advances in electron imaging, image interpretation and applications: environmental scanning electron

¹Polymers & Colloids Group, Department of Physics, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK. djs49@phy.cam.ac.uk

|December 12, 2003

Summary

Environmental scanning electron microscopy (ESEM) allows imaging of untreated soft, moist, or insulating materials. This review covers ESEM

Area of Science:

Background:

Conventional scanning electron microscopy (SEM) requires specimens to be solid, dry, and electrically conductive, limiting analysis of many materials.
Environmental scanning electron microscopy (ESEM) overcomes these limitations, enabling imaging of specimens in their native states.

Purpose of the Study:

To introduce the principles and capabilities of Environmental Scanning Electron Microscopy (ESEM).
To discuss the implications of ESEM for analyzing diverse specimen types without pre-treatment.
To review the unique physical and chemical considerations for ESEM imaging and potential applications.

Main Methods:

Description of the Environmental Scanning Electron Microscope (ESEM) technology.
Discussion of electron beam-specimen interactions in a partial vacuum environment.
Consideration of specimen stability and dynamic imaging possibilities.

Main Results:

ESEM facilitates the study of soft, moist, and insulating materials, expanding the scope of electron microscopy.
New factors influencing electron signal emission and detection unique to ESEM are identified.
Potential for novel dynamic analyses of specimens in their natural conditions is highlighted.

Conclusions:

ESEM represents a significant advancement in electron microscopy, broadening analytical capabilities.
Understanding ESEM-specific imaging physics and specimen behavior is crucial for accurate interpretation.
ESEM opens new avenues for research in fields requiring in-situ analysis of delicate or hydrated samples.

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