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Updated: Aug 29, 2026

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
Dispersion corrections of the copper K edge measured by Fresnel diffraction
Wah-Keat Lee1, Peter Cloetens, Michel Schlenker
1Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439, USA. wklee@aps.anl.gov
Abstract:
Dispersion corrections to the atomic scattering factors for the copper K edge have been measured by a new technique, Fresnel diffraction. Fresnel diffraction fringes were measured at several sample-detector distances as a function of energy across the copper K-absorption edge. The dispersion corrections were obtained from optimizing a least-squares fit of Fresnel fringe simulations to the measured data.
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