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A differentially pumped secondary electron detector for low-vacuum scanning electron microscopy

M Jacka1, M Zadrazil, F Lopour

  • 1Department of Physics, University of York, Heslington, York, UK. mj13@york.ac.uk

Scanning
|January 30, 2004
PubMed
Summary

A novel secondary electron (SE) detector design for low-vacuum scanning electron microscopes features a separate chamber to maintain independent pressures. This innovation enhances SE contrast while minimizing backscattered electron interference.

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