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Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 15, 2013
Profiling the thermoelectric power of semiconductor junctions with nanometer resolution
Ho-Ki Lyeo1, A A Khajetoorians, Li Shi
1Department of Physics, University of Texas, Austin, TX 78712, USA.
Summary
We used scanning thermoelectric microscopy to measure the thermoelectric power of semiconductor nanostructures. This technique precisely maps thermoelectric properties and electronic structures at the nanoscale, crucial for advanced devices.
Area of Science:
- Condensed Matter Physics
- Materials Science
- Nanotechnology
Background:
- Thermoelectric power is a key property for energy harvesting and electronic devices.
- Understanding thermoelectric properties at the nanoscale is critical for developing next-generation technologies.
- Semiconductor junctions are fundamental components in various electronic and optoelectronic applications.
Purpose of the Study:
- To investigate the local thermoelectric power of semiconductor nanostructures.
- To develop and apply ultrahigh-vacuum scanning thermoelectric microscopy for nanoscale characterization.
- To correlate thermoelectric power with electronic structure and carrier concentration in semiconductor junctions.
Main Methods:
- Utilizing ultrahigh-vacuum scanning thermoelectric microscopy.
- Probing the local thermoelectric power of semiconductor nanostructures.
- Analyzing p-n junctions to observe thermoelectric property variations.
Main Results:
- Thermoelectric power was measured with nanometer spatial resolution.
- A sharp sign change in thermoelectric power was observed within 2 nanometers across a p-n junction.
- The method allows for profiling of thermoelectric power, band structures, and carrier concentrations.
Conclusions:
- Ultrahigh-vacuum scanning thermoelectric microscopy is effective for nanoscale thermoelectric characterization.
- The observed abrupt change in thermoelectric power highlights the importance of nanoscale junction properties.
- This technique provides essential insights for designing advanced thermoelectric, electronic, and optoelectronic devices.

