Profiling the thermoelectric power of semiconductor junctions with nanometer resolution

Ho-Ki Lyeo1, A A Khajetoorians, Li Shi

  • 1Department of Physics, University of Texas, Austin, TX 78712, USA.

Science (New York, N.Y.)
|February 7, 2004
PubMed
Summary

We used scanning thermoelectric microscopy to measure the thermoelectric power of semiconductor nanostructures. This technique precisely maps thermoelectric properties and electronic structures at the nanoscale, crucial for advanced devices.

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