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Pinhole interferometry with coherent hard X-rays.

Wolfram Leitenberger1, Horst Wendrock, Lothar Bischoff

  • 1Universität Potsdam, Institut für Physik, Am Neuen Palais 10, D-14469 Potsdam, Germany. leitenberger@rz.uni-potsdam.de

Journal of Synchrotron Radiation
|February 13, 2004
PubMed
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Researchers experimentally realized two X-ray interferometers using pinhole diffraction. This technique allowed for determining X-ray coherence and spectral refractive index for metal foils, advancing X-ray optics.

Area of Science:

  • Optics and Photonics
  • X-ray Physics
  • Materials Science

Background:

  • X-ray interferometry is crucial for high-resolution imaging and material analysis.
  • Pinhole diffraction offers a method for generating coherent X-ray waves.
  • Characterizing X-ray properties requires advanced experimental setups.

Purpose of the Study:

  • To experimentally demonstrate two types of X-ray interferometers utilizing pinhole diffraction.
  • To investigate the diffraction properties of white synchrotron radiation across a broad spectral range.
  • To determine the coherence of X-rays and the spectral refractive index of materials.

Main Methods:

  • Utilized a beam splitter with micrometer pinholes in a thin metal foil.
  • Employed an energy-dispersive detector for simultaneous spectral analysis.

Related Experiment Videos

  • Recorded interference patterns from Young's double-pinhole and point diffraction configurations.

    • Main Results:

    • Successfully recorded interference fringes for a highly absorbing pinhole mask, enabling coherence determination.
    • Observed point diffraction interferometer patterns with low-absorption foils at higher X-ray energies (>15 keV).
    • Determined the spectral refractive index of the metal foil material.

    Conclusions:

    • Pinhole diffraction is a viable technique for creating X-ray interferometers.
    • The experimental setup allows for simultaneous measurement of X-ray coherence and material optical properties.
    • This work contributes to the development of advanced X-ray optical components and measurement techniques.