C O S Sorzano1, R Marabini, G T Herman
1Escuela Politécnica Superior, Universidad San Pablo-CEU, Campus Urb Montepríncipe, s/n, 28668 Boadilla del Monte, Madrid, Spain.
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Iterative data refinement (IDR) improves three-dimensional electron microscopy (3D-EM) by correcting for the contrast transfer function (CTF) effects. This method enhances resolution in noisy 3D reconstructions.
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