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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Probing the structure of the silylene complex (Cy3P)2Pt=SiMes2.; UV-Vis and pre-resonance Raman investigations
Larissa A Leites1, Sergey S Bukalov, Irina A Garbuzova
1Institute of Organoelement Compounds, Scientific and Technical Center on Raman Spectroscopy, Russian Academy of Sciences, 28 Vavilova Str., Moscow 119991, Russia.
Abstract:
The UV-Vis, pre-resonance Raman and IR spectra of the complex (Cy3P)2Pt=SiMes2 (1) were obtained as well as Raman spectra of some model compounds. The experimental data and the results of normal coordinate calculations show that the stretching vibration of the Si?Pt bond in 1 is not localized, the nuSi=Pt internal coordinate makes significant contribution to two normal modes with frequencies at 465 and 612cm-1, whose Raman intensity is enhanced by pre-resonance.

