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Related Experiment Videos

Imaging surface spectroscopy for two- and three-dimensional characterization of materials.

H Hutter1, C Brunner, S Nikolov

  • 1Institute of Analytical Chemistry, University of Technology Vienna, Getreidemarkt 9, A-1060, Wien, Austria.

Analytical and Bioanalytical Chemistry
|June 1, 1996
PubMed
Summary

Secondary ion mass spectrometry (SIMS) enables detailed 2D and 3D trace element analysis in materials. Chemometric tools like neural networks and wavelet filtering enhance data interpretation for advanced material characterization.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Advanced materials require precise characterization of trace element distribution.
  • Secondary Ion Mass Spectrometry (SIMS) offers unique capabilities for 2D and 3D elemental mapping.
  • Processing vast amounts of imaging data necessitates advanced analytical tools.

Purpose of the Study:

  • To demonstrate the application of SIMS for trace element analysis in technological problems.
  • To showcase the utility of chemometric tools for enhancing SIMS data interpretation.
  • To investigate material segregation in high purity iron and corrosion in high purity chromium.

Main Methods:

  • Secondary Ion Mass Spectrometry (SIMS) for elemental distribution measurements.

Related Experiment Videos

  • Segregation experiments on high purity iron.
  • Oxidation studies on high purity chromium using (16)O and (18)O isotopes.
  • Application of chemometric tools: neural networks for classification and wavelet filtering for de-noising.

    • Main Results:

    • Successful measurement of initial and final trace element distributions in high purity iron.
    • Analysis of oxide layer growth and adhesion in high purity chromium.
    • Demonstrated improvement in analytical imaging performance through chemometric data processing.

    Conclusions:

    • SIMS is a powerful technique for 2D/3D trace element analysis in advanced materials.
    • Chemometric tools are essential for extracting meaningful information from complex SIMS datasets.
    • Enhanced data analysis significantly improves the performance of analytical imaging techniques.