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Updated: Aug 25, 2026

A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)
Published on: July 11, 2017
Comparison of various calibration techniques for the direct spectroscopical analysis of SiC powders
K Flórián1, J Hassler, W Schrön
1Department of Chemistry, Faculty of Metallurgy, Technical University of Kosice, Letná 9, SK-042 00, Kosice, Slovakia.
Abstract:
Techniques for the direct analysis of powdered advanced ceramics provide an advantageous alternative to methods using wet digestion in sample preparation. The direct spectrochemical methods based on electrothermal vaporization (ETV-ICP-OES, solid-ETV-AAS, etc.) show a great similarity to the classical method of d. c. arc excitation. The calibration procedure is the major difficulty of all techniques applied for direct solid sample analysis, as there is a lack of suitable reference materials of ceramics. Consequently, it was necessary to verify various possibilities of preparation and application of model calibration samples. The results of such a calibration are compared with those using within-laboratory standards.
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