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Related Experiment Videos

Quantitative surface analysis by total electron yield.

H Ebel1, N Zagler, R Svagera

  • 1Institut für Angewandte und Technische Physik, Technische Universität Wien, Wiedner Hauptstrasse 8-10, A-1040, Wien, Austria.

Analytical and Bioanalytical Chemistry
|October 1, 1995
PubMed
Summary
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Total electron yield (TEY) spectroscopy uses x-rays to measure electron emission from solid surfaces. This technique allows for both qualitative and quantitative elemental analysis by observing changes in electron yield at absorption edges.

Area of Science:

  • Surface Science
  • Materials Analysis
  • Spectroscopy

Background:

  • X-ray irradiation of solid surfaces under vacuum induces electron emission via photoabsorption.
  • Total electron yield (TEY) measures this emission, neglecting electron kinetic energies.
  • TEY analysis is valuable for characterizing solid sample surfaces.

Purpose of the Study:

  • To demonstrate the utility of TEY spectroscopy for elemental analysis.
  • To establish TEY as a method for both qualitative and quantitative analysis.
  • To define the analytical capabilities and limitations of TEY.

Main Methods:

  • Irradiating solid samples with tuneable x-rays under vacuum.
  • Measuring the total electron yield (TEY) below and above elemental absorption edges.

Related Experiment Videos

  • Employing a fundamental parameter approach for quantitative analysis, considering primary and secondary excitations.

    • Main Results:

    • A distinct, jumplike increase in TEY signal observed at absorption edges indicates qualitative elemental presence.
    • The magnitude of the TEY jump correlates directly with the elemental concentration, enabling quantitative analysis.
    • The information depth (lambda) of TEY ranges from approximately 2-400 nm, depending on elements and electron energies.

    Conclusions:

    • TEY spectroscopy is a versatile technique for elemental analysis of solid surfaces.
    • It offers a complementary approach, bridging the information depth between photoelectron spectrometry and X-ray fluorescence analysis.
    • The method provides a robust framework for both identifying and quantifying elemental composition.