S D Böhmig1, M Schmid, H Störi
1Institut für Allgemeine Physik, Technische Universität Wien, A-1040, Wien, Austria.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Maximum Entropy enhances scanning tunneling microscopy (STM) images for clearer atomic resolution. This method sharpens images, improving the accuracy of atomic position determination in materials science.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: