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Magnetic characterization of microscopic particles by MO-SNOM
J Schoenmaker1, M S Lancarotte, A C Seabra
1Instituto de Física da Universidade de São Paulo, CP 66318, ZIP 05315-970, São Paulo, Brazil. jeroen@macbeth.if.usp.br
Journal of Microscopy
|March 31, 2004
Summary
A new magneto-optical scanning near-field microscope visualizes magnetic domain structures in amorphous thin films. This technique enables high-resolution imaging and local hysteresis loop acquisition for magnetic particle analysis.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Understanding magnetic domain structures is crucial for developing advanced magnetic materials.
- Existing techniques may lack the spatial resolution required for detailed analysis of nanoscale magnetic features.
Purpose of the Study:
- To develop a magneto-optical scanning near-field optical microscope (MS-SNOM).
- To experimentally investigate the domain structure of a model magnetic particle using the developed MS-SNOM.
- To demonstrate the capability of acquiring local hysteresis loops with sub-micrometer resolution.
Main Methods:
- Development of a magneto-optical scanning near-field optical microscope.
- Fabrication of a CoFeSiB amorphous thin film magnetic particle on a silicon substrate.
- Acquisition of topographic, optical, and magneto-optical differential susceptibility (MODS) images.
- Utilizing local MODS for domain structure imaging and tip positioning for local hysteresis loop measurements.
Main Results:
- Successful development and implementation of the MS-SNOM.
- Detailed imaging of the domain structure within the model magnetic particle.
- Demonstration of sub-micrometer spatial resolution in magneto-optical imaging.
- Acquisition of local hysteresis loops, revealing magnetic properties at the nanoscale.
Conclusions:
- The developed MS-SNOM is effective for visualizing nanoscale magnetic domain structures.
- Local MODS imaging provides valuable insights into the magnetic behavior of amorphous thin films.
- The technique allows for precise characterization of magnetic particles with high spatial resolution.