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Updated: Dec 20, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Guoliang Wang1, Hans Arwin, Roger Jansson
1Department of Physics and Measurement Technology, Laboratory of Applied Optics, Linköping University, SE-581 83, Linköping, Sweden. guowa@ifm.liu.se
This study optimizes ellipsometric sensor angles for maximum signal change in sensing layers. It analytically derives optimal conditions, showing ellipsometry
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