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Sublattice identification in scanning force microscopy on alkali halide surfaces.

R Hoffmann1, L N Kantorovich, A Baratoff

  • 1National Center of Competence in Research on Nanoscale Science, Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland. r.hoffmann@physik.uni-karlsruhe.de

Summary

This study introduces a new scanning force microscopy (SFM) method for identifying atomic species on ionic crystal surfaces. The technique successfully distinguishes positive and negative sublattices and determines tip apex polarity.

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