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Dynamics of exciton formation at the Si(100) c(4 x 2) surface
Martin Weinelt1, Michael Kutschera, Thomas Fauster
1Lehrstuhl für Festkörperphysik, Universität Erlangen-Nürnberg, Staudtstrasse 7, D-91058 Erlangen, Germany. weinelt@physik.uni-erlangen.de
Abstract:
Carrier recombination at the Si(100) c(4 x 2) surface and the underlying surface electronic structure is unraveled by a combination of two-photon photoemission and many-body perturbation theory: An electron excited to the silicon conduction band by a femtosecond infrared laser pulse scatters within 220 ps to the unoccupied surface band, needs 1.5 ps to jump to the band bottom via emission of optical phonons, and finally relaxes within 5 ps with an excited hole in the occupied surface band to form an exciton living for nanoseconds.
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