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Improved specimen preparation for cryo-electron microscopy using a symmetric carbon sandwich technique

Nobuhiko Gyobu1, Kazutoshi Tani, Yoko Hiroaki

  • 1Department of Biophysics, Faculty of Science, Kyoto University, Kyoto-fu, Japan.

Summary

Specimen charging in electron microscopy causes image shift, hindering analysis of 2D crystals. A carbon sandwich preparation method significantly reduces this charging, improving image quality and accelerating structural studies.

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