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Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local
Wenge Yang1, B C Larson, J Z Tischler
1Condensed Matter Sciences Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831, USA. yangw@ornl.gov
Micron (Oxford, England : 1993)
|May 4, 2004
Summary
Differential-aperture X-ray microscopy (DAXM) offers high-resolution 3D analysis of material structure and orientation. This technique enables precise measurements of lattice distortions and strain, advancing materials science research.
Area of Science:
- Materials Science
- Crystallography
- Physics
Background:
- Traditional electron microscopy has limitations in probing mesoscopic length scales.
- Understanding local structure and crystallographic orientation is crucial for materials characterization.
Purpose of the Study:
- To review the differential-aperture X-ray microscopy (DAXM) technique.
- To demonstrate DAXM's capabilities in analyzing microtexture, elastic strain, and plastic deformation.
Main Methods:
- Utilizes microbeams from high brilliance synchrotron X-ray sources.
- Employs differential-aperture X-ray microscopy (DAXM) for 3D analysis.
- Achieves submicron spatial resolution and high angular precision (~0.01 degrees).
Main Results:
- DAXM provides accurate measurements of local elastic strain (~1.0 x 10(-4)).
- Enables detailed inter- and intra-granular studies of lattice distortions and rotations.
- Offers non-destructive, spatially resolved measurements of lattice orientations in bulk materials.
Conclusions:
- DAXM is a powerful tool for mesoscopic materials characterization.
- The technique provides direct information on geometrically necessary dislocation density distributions.
- DAXM advances the study of microtexture and plastic deformation in materials.