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Related Experiment Videos

Noise in flat-panel displays with subpixel structure.

Aldo Badano1, Robert M Gagne, Robert J Jennings

  • 1Center for Devices and Radiological Health, Food and Drug Administration, 12720 Twinbrook Parkway, Rockville, Maryland 20857, USA. agb@cdrh.fda.gov

Medical Physics
|May 6, 2004
PubMed
Summary
This summary is machine-generated.

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Noise in medical active-matrix liquid crystal displays (AMLCDs) is primarily caused by subpixel structure, not interpixel variations. New methods allow accurate luminance noise comparison across display technologies.

Area of Science:

  • Medical Imaging
  • Display Technology
  • Optical Physics

Background:

  • Subpixel structures in active-matrix liquid crystal displays (AMLCDs) complicate accurate noise estimation.
  • Conventional noise measurement methods are affected by pixel design and device technology.

Purpose of the Study:

  • To develop methods for identifying noise sources in AMLCDs.
  • To enable comparison of luminance noise estimates across different display technologies, independent of pixel design.
  • To differentiate noise originating from subpixel structure versus interpixel variations.

Main Methods:

  • Utilized a three-million pixel AMLCD with a specific in-plane switching, two-domain, color stripe pixel structure.
  • Acquired images of uniform fields using a low-noise, high-resolution CCD camera.

Related Experiment Videos

  • Characterized camera noise and flat-field response with a dedicated uniform light source.
  • Analyzed spatial luminance noise and noise power spectrum on high-resolution images and pixel-aligned aperture processed images.

    • Main Results:

    • Identified that subpixel structures significantly impact luminance noise estimates.
    • Demonstrated that a pixel-aligned aperture effectively eliminates most observed noise in high-resolution images.
    • Found that luminance noise in AMLCDs predominantly stems from subpixel structure and aperture ratio, not interpixel variations.

    Conclusions:

    • The subpixel structure and aperture ratio are the primary contributors to luminance noise in AMLCDs.
    • The developed methods allow for technology-independent comparison of luminance noise.
    • Accurate noise assessment in displays requires accounting for subpixel-level characteristics.