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Rapid analysis of metallic dental restorations using X-ray scanning analytical microscopy
1Dental Materials and Engineering, Department of Oral Health Science, Graduate School of Dental Medicine, Hokkaido University, North 13 West 7, Kita-ku, Sapporo-shi 060-8586, Japan. uo@den.hokudai.ac.jp
Objectives:
X-ray scanning analytical microscopy (XSAM) makes it possible to analyze small specimens in air without pretreatment. The purpose of this study was to utilize XSAM for the rapid analysis of metallic dental restorations by microsampling.
Methods:
Six different dental alloys were scratched with brand-new silicone points to obtain metal on the silicone point for compositional analysis. The fluorescent spectra of XSAM were measured to determine the metal attached to the specimen.
Results:
The major components of the six dental metals, except for palladium, were clearly detected. The identification of palladium was difficult since the fluorescent X-ray of palladium is quite close to that of rhodium, which is the source metal of the incident X-rays. However, with a slight modification of XSAM, palladium was also identified. The total time required for sampling and analysis with XSAM was less than 10 min. The amount of the attached metal was estimated to be less than 30 microg. This amount of sampling does not damage metal restorations.
Significance:
XSAM analysis using the microsampling technique is useful for the rapid analysis of metallic restorations.
