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A low-voltage wide-input CMOS comparator for sensor application using back-gate technique.

Yu-Cherng Hung1, Bin-Da Liu

  • 1Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, ROC.

Biosensors & Bioelectronics
|May 15, 2004
PubMed
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This paper introduces two novel analog CMOS comparators designed for low-voltage operation and wide input ranges. These circuits offer efficient signal processing for data conversion and sensory applications.

Area of Science:

  • Electrical Engineering
  • Microelectronics
  • Analog Circuit Design

Background:

  • Analog comparators are crucial for data conversion and signal processing.
  • Existing comparators often require higher supply voltages and have limited input ranges.
  • Low-voltage, wide-input comparators are needed for modern portable and integrated systems.

Purpose of the Study:

  • To propose two new analog CMOS comparator designs, Type-I and Type-II.
  • To achieve low-voltage operation (1V supply) without special fabrication processes.
  • To enhance the input range using the CMOS back-gate technique.

Main Methods:

  • Design of two analog CMOS comparator circuits (Type-I and Type-II).
  • Utilizing a bulk-driven stage and a dynamic latch.

Related Experiment Videos

  • Employing the CMOS back-gate technique to improve input range.
  • Simulations performed using HSPICE with CMOS n-well technology.

    • Main Results:

    • Type-I comparator demonstrates a response time of 1 microsecond with a 10 mV resolution.
    • Type-II comparator achieves a 5 mV resolution.
    • Both comparators exhibit approximately rail-to-rail input dynamic ranges.
    • Successful low-voltage (1V) operation confirmed.

    Conclusions:

    • The proposed Type-I and Type-II analog CMOS comparators meet low-voltage and wide-input requirements.
    • The designs are suitable for data conversion and sensory signal processing applications.
    • The CMOS back-gate technique effectively expands the input dynamic range.