Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Surface characterization from doubly scattered light.

Fernando Perez-Quintián1, María A Rebollo

  • 1Laboratorio de Aplicaciones Opticas, Departamento de Física, Facultad de Ingeniería, Universidad de Buenos Aires, Paseo Colón 850, C1063ACU Buenos Aires, Argentina. fperez@fi.uba.ar

Applied Optics
|May 18, 2004
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Full-field high-frequency surface vibration amplitude measurement from an out-of-focus and blurred speckle image.

Applied optics·2026
Same author

Far-field angular distribution of the mean scattered intensity from strong diffusers by means of a near-field intensity pattern.

Applied optics·2010
Same author

Optical encoder based on a nondiffractive beam III.

Applied optics·2009
Same author

Optical encoder based on a nondiffractive beam II.

Applied optics·2009
Same author

Optical encoder based on a nondiffractive beam.

Applied optics·2008
Same author

Linear displacement measurement with a grating and speckle pattern illumination.

Applied optics·2006
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Displacing a diffuser surface alters its speckle pattern. This decorrelation relates to the surface

Area of Science:

  • Optics and photonics
  • Materials science

Background:

  • Speckle patterns arise from coherent light scattering.
  • Surface displacement can alter light scattering properties.

Purpose of the Study:

  • To investigate the relationship between surface displacement and speckle pattern decorrelation.
  • To explore a novel method for quantifying surface changes using speckle analysis.

Main Methods:

  • Illuminating a translucent diffuser with a small speckle pattern.
  • Measuring speckle pattern decorrelation due to surface displacement.
  • Analyzing the standard deviation of the surface slope distribution.
  • Comparing results with angular distribution of mean scattered intensity.

Main Results:

Related Experiment Videos

  • Speckle pattern decorrelation is directly related to the standard deviation of the surface slope distribution.
  • This relationship holds when the illuminating speckle grain size is sufficiently small.
  • Experimental findings align well with measurements of scattered intensity distribution.

Conclusions:

  • Speckle pattern analysis provides a viable method for quantifying surface displacement.
  • The standard deviation of the slope distribution is a key parameter in this analysis.
  • This technique offers a complementary approach to traditional scattered intensity measurements.