Multiphoton double ionization via field-independent resonant excitation

The double ionization of xenon in the multiphoton regime has been studied at two wavelengths (0.77 and 0.79 microm) using an electron-ion coincidence technique and an intensity binned ion ratio method. Sharp resonant structures in the electron energy distribution correlated with the doubly charged ion, as well as a wavelength dependence of the Xe(2+)/Xe(+) ratio provides new insights. A mechanism involving the shelving of population in Rydberg states followed by excitation of a core electron is proposed.