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Total internal reflection ellipsometry: principles and applications.

Hans Arwin1, Michal Poksinski, Knut Johansen

  • 1Department of Physics and Measurement Technology, Laboratory of Applied Optics, Linköping University, SE-581 83 Linköping, Sweden.

Applied Optics
|June 5, 2004
PubMed
Summary
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Total internal reflection ellipsometry (TIRE) enhances surface analysis by combining total internal reflection with surface plasmon resonance. This powerful technique improves thin-film sensitivity for adsorption and material analysis.

Area of Science:

  • Optics and Photonics
  • Surface Science
  • Materials Science

Background:

  • Ellipsometry is a surface-sensitive optical technique.
  • Surface plasmon resonance (SPR) enhances sensitivity to surface changes.
  • Analyzing thin semitransparent films and surface adsorption requires advanced methods.

Purpose of the Study:

  • To present a novel measurement technique, total internal reflection ellipsometry (TIRE).
  • To combine total internal reflection with SPR for enhanced surface analysis.
  • To demonstrate TIRE's capability for monitoring adsorption/desorption and analyzing semitransparent films.

Main Methods:

  • Theoretical analysis of ellipsometry under total internal reflection combined with SPR.
  • Simulations using Fresnel formalism for complex cases.

Related Experiment Videos

  • Experimental validation of the TIRE concept.

    • Main Results:

    • TIRE demonstrates significantly enhanced thin-film sensitivity compared to ordinary ellipsometry.
    • Simulations and experiments confirm the effectiveness of the TIRE technique.
    • The technique is applicable to various scenarios, including adsorption and corrosion.

    Conclusions:

    • TIRE is a powerful technique for analyzing thin semitransparent metal films.
    • TIRE offers enhanced sensitivity for monitoring adsorption and desorption processes.
    • The technique has broad applications in materials science, corrosion monitoring, and biomolecular analysis.