Peak resolution and tailing in alpha-particle spectrometry for environmental samples

Peak resolution in alpha-particle spectrometry is generally quoted as full-width-at half maximum. However, the extent of tailing of alpha particle peaks into regions of lower energy is often a critical factor for accurate spectral analysis, particularly given the relatively low count rates observed for many environmental samples. In this paper we examine the influence of various factors on peak resolution and tailing for spectra collected using solid-state alpha detectors, in particular chamber gas pressure and source deposit thickness.