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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Absolute measurement of a long, arbitrary distance to less than an optical fringe
1JILA, National Institute of Standards and Technology, and University of Colorado, Boulder, Colorado 80309-0440, USA. ye@jila.colorado.edu
Abstract:
A scheme is proposed for high-precision, absolute length measurement for an arbitrary optical distance of a few meters to beyond 10(6) m. The approach utilizes a phase-stabilized femtosecond laser to provide both incoherent, time-of-flight information and coherent, fringe-resolved interferometry. Such a combined measurement capability allows an optical wavelength resolution to be achieved for absolute length measurement over a large dynamic range.
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