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Depth-resolved strain measurements in polycrystalline materials by energy-variable X-ray diffraction

E Zolotoyabko1, B Pokroy, J P Quintana

  • 1Department of Materials Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel. zloto@tx.technion.ac.il

Journal of Synchrotron Radiation
|June 24, 2004
PubMed

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