Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Improving tapping mode atomic force microscopy with piezoelectric cantilevers.

B Rogers1, L Manning, T Sulchek

  • 1Department of Mechanical Engineering and the Nevada Ventures Nanoscience Program, University of Nevada, Reno, Reno, NV 89557, USA. rogers@unr.edu

Ultramicroscopy
|July 3, 2004
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

This story shall the good [surgeon] teach.

Annals of the Royal College of Surgeons of England·2026
Same author

Certification of radiation protection professionals in Australia and New Zealand.

Annals of the ICRP·2026
Same author

Oral Rehydration Improved Exercise Performance and Decreased Core Temperature and Heartrate Compared With Intravenous Rehydration in Recreationally Active Men.

Sports health·2026
Same author

To be… an author.

Annals of the Royal College of Surgeons of England·2025
Same author

Knowledge and caring.

Annals of the Royal College of Surgeons of England·2025
Same author

"It's no use going back to yesterday".

Annals of the Royal College of Surgeons of England·2024

New atomic force microscopy (AFM) uses a self-sensing, self-oscillating piezoelectric microcantilever for faster, simpler imaging. This advanced tapping mode AFM enhances speed and versatility, especially in liquid environments.

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
  • Tapping mode AFM offers advantages but faces limitations in speed and complexity.
  • Existing piezoelectric microcantilevers have limitations in performance and integration.

Purpose of the Study:

  • To develop and demonstrate a simplified, high-speed tapping mode AFM system.
  • To improve the speed, simplicity, and versatility of AFM imaging.
  • To showcase novel self-sensing and self-oscillating capabilities in AFM.

Main Methods:

  • Utilized a piezoelectric microcantilever with an integrated sharp silicon tip and zinc oxide (ZnO) film.
  • Demonstrated self-sensing tapping mode AFM, eliminating the need for laser detection.

Related Experiment Videos

  • Implemented self-oscillating tapping mode AFM by integrating the cantilever into an oscillator circuit.
  • Tested high-speed tapping mode imaging in liquid with insulated microactuators.

    • Main Results:

    • Achieved self-sensing amplitude resolution comparable to or better than optical detection with doubled sensitivity.
    • Successfully demonstrated self-oscillating tapping mode AFM with integrated piezoelectric actuation and sensing.
    • Presented preliminary high-speed tapping mode images in liquid at speeds up to 75.5 microm/s, a threefold bandwidth improvement.
    • Evaluated three different cantilever insulation schemes for liquid operation.

    Conclusions:

    • The developed piezoelectric microcantilever significantly enhances tapping mode AFM performance.
    • Self-sensing and self-oscillating capabilities simplify AFM operation and improve resolution.
    • High-speed liquid imaging is feasible, opening new avenues for nanoscale analysis in biological and chemical environments.