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AFM-induced amine deprotection: triggering localized bond cleavage by application of tip/substrate voltage bias for

Zachary M Fresco1, Itai Suez, Scott A Backer

  • 1Department of Chemistry, University of California Berkeley, Berkeley, California, 94720-1460, USA.

Journal of the American Chemical Society
|July 9, 2004
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...