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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
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A regression technique to analyze the second-order nonlinear optical response of thin films

Mikael Siltanen1, Stefano Cattaneo, Elina Vuorimaa

  • 1Optics Laboratory, Tampere University of Technology, P.O. Box 692, 33101 Tampere, Finland.

The Journal of Chemical Physics
|July 21, 2004
PubMed

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