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An Improved Mechanical Testing Method to Assess Bone-implant Anchorage
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On the effect of ion implantation in the microstructure of GaN: an XAFS study

M Katsikini, J Bollmann, W T Masselink

    Journal of Synchrotron Radiation
    |July 21, 2004
    PubMed
    Abstract

    No abstract available in PubMed .

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