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Related Experiment Videos

X-ray magnetic reflectometry using circularly polarized radiation.

C Neumann1, A Rogalev, J Goulon

  • 1European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble, France.

Journal of Synchrotron Radiation
|July 21, 2004
PubMed
Summary

Researchers utilized X-ray magnetic reflectometry at rhodium

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Area of Science:

  • Condensed matter physics
  • Materials science
  • X-ray optics

Background:

  • X-ray magnetic reflectometry is a powerful technique for probing magnetic properties of materials.
  • High polarization rates are crucial for obtaining high-quality data in such experiments.

Purpose of the Study:

  • To perform X-ray magnetic reflectometry experiments at the L(2,3) edges of rhodium.
  • To demonstrate the effectiveness of a novel compact double-bounce reflectometer configuration.
  • To showcase the utilization of high polarization rates from helical undulator sources.

Main Methods:

  • X-ray magnetic reflectometry at the L(2,3) edges of rhodium.
  • Utilizing a compact double-bounce reflectometer upstream of the monochromator.
  • Leveraging a helical undulator source for high polarization.

Main Results:

  • High-quality experimental data were obtained with minimal accumulation time.
  • The double-bounce reflectometer configuration effectively utilizes the source's polarization.
  • Experimental differential X-ray reflectivity spectra can be tuned to be dominated by dispersion or absorption terms by adjusting the angle of incidence.

Conclusions:

  • The novel reflectometer configuration significantly enhances data quality in X-ray magnetic reflectometry.
  • This technique provides a versatile method for investigating magnetic properties of rhodium.
  • The ability to control spectral dominance offers new avenues for materials characterization.

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