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Updated: Aug 23, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
Published on: November 21, 2019
X-ray magnetic reflectometry using circularly polarized radiation
C Neumann1, A Rogalev, J Goulon
1European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble, France.
Abstract:
Magnetic reflectometry experiments have been performed in the X-ray range at the L(2,3) edges of rhodium. What makes these experiments original is the insertion of a very compact double-bounce reflectometer upstream of the monochromator. This configuration makes full use of the high polarization rate of the helical undulator source. This advantage is reflected in the high quality of the data obtained after only a few accumulations. It is also shown that, by properly selecting the angle of incidence, one may obtain experimental differential X-ray reflectivity spectra dominated either by the dispersion or the absorption terms.
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