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Related Experiment Videos

Experimental comparison between the conversion electron yield and X-ray fluorescence in catalyst analysis.

S Zheng1, Y Gohshi

  • 1Department of Applied Chemistry, School of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113, Japan.

Journal of Synchrotron Radiation
|July 21, 2004
PubMed
Summary

The conversion-electron-yield (CEY) method offers a shallower probing depth for catalyst analysis compared to X-ray fluorescence (XRF). This technique shows promise for analyzing low-concentration zeolite catalysts, including powder samples.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Catalyst analysis is crucial for optimizing chemical processes.
  • Traditional methods like X-ray fluorescence (XRF) have limitations in probing depth.
  • Developing advanced analytical techniques is essential for detailed material characterization.

Purpose of the Study:

  • To assess the utility of the conversion-electron-yield (CEY) method for catalyst analysis.
  • To compare the probing capabilities of CEY with XRF.
  • To explore CEY's applicability to challenging catalyst samples.

Main Methods:

  • Simultaneous measurement of CEY and XRF intensities.
  • Varying the glancing angle during measurements to probe different depths.

Related Experiment Videos

  • Analysis of both solid and powder catalyst specimens.

    • Main Results:

    • The CEY method demonstrated a significantly shallower probing depth than XRF.
    • CEY successfully analyzed a low-concentration zeolite catalyst powder specimen.
    • Simultaneous measurements provided comparative depth-profiling data.

    Conclusions:

    • CEY is a valuable surface-sensitive technique for catalyst analysis.
    • Its shallow probing depth is advantageous for surface-focused studies.
    • CEY shows potential for analyzing challenging, low-concentration, and powder catalysts.