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Updated: Aug 23, 2026

Analysis of SEC-SAXS data via EFA deconvolution and Scatter
10:59

Analysis of SEC-SAXS data via EFA deconvolution and Scatter

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XAFS spectra from reflectivity measurements

K Tani1, T Nanjyo, S Masui

  • 1Ricoh R & D Center, Tsuzuki-ku, Yokohama 224, Japan.

Journal of Synchrotron Radiation
|July 21, 2004
PubMed

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