Imaging of growth banding of minerals using 2-stage sectioning: application to accessory zircon

In the past, investigations of mineral growth were routinely carried out by the application of light-microscopic methods and, later on, by the production of single crystal sections and their documentation using specific imaging techniques (CL, BSEI, etc.). In the present work, a method is described which enables the precise sectioning of elongate crystals parallel and perpendicular to their longest axis. By examining backscattered electron images of parallel and perpendicular sections of the same grain, growth of all faces may be evaluated without major geometric correction. The new technique is applied to zircon crystals of a granitoid exposed in the southwestern Bohemian Batholith, Austria. For the studied zircon population, pyramidal and prism development during crystal growth is worked out very clearly by the imaging procedure. Besides its significance in crystal studies, the introduced method could also find a use in material science for the growth study of synthetic mineral phases.